03
Jun
by Tektronix Advanced Semiconductor Laboratory To more thoroughly assess the aging characteristics of power devices, high-temperature operating life (HTOL) tests have increasingly gained attention from power device test engineers. HTOL replicates the operational conditions of power devices by integrating them into actual power circuits. By subjecting devices to stress through continuous hard or soft switching circuits, HTOL delivers aging effects that closely mimic real-world usage, providing...
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